製品変更通知
| Change Notification # |
|
16353 |
| Revision |
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| Type of Notification |
|
FINAL PRODUCT/PROCESS CHANGE NOTIFICATION |
| Change Title |
|
Qualification of Aizu, Japan Fab to Source NMOS Die in ON Semiconductor Over-Voltage Protection Devices. |
| Issue Date |
|
2009-10-23 |
| Affected Product Family |
|
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| Description |
|
ON Semiconductor is pleased to issue this final process change notice announcing the qualification of the ON Semiconductor wafer fabrication facility in Aizu, Japan as a source for the NMOS FET die used in the Over-Voltage Protection family of devices. This qualification was originally announced in Initial PCN #16249. Upon expiration of this Final PCN, both the existing wafer foundry and the ON Semiconductor Aizu, Japan facility will be qualified sources for this NMOS FET die.
|
| Key Items Affected by Change |
|
ON Semiconductor Wafer Fab Site |
| |
| Key Milestones |
|
| Effective Date: |
|
2009-01-23 |
| Sample Info: |
|
Contact your local ON Semiconductor Sales Office |
| Possible Replacements |
|
N/A |
For more information on this Process Change Notification, please
contact your local ON Semiconductor sales office.
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